Job Summary
The scientist is responsible for utilizing Dual Beam FIB/SEM systems to conduct TEM lamella preparation, perform cross-sectioning, and achieve imaging for the purpose of materials analysis. Additionally, the individual will engage with cross-functional teams to offer technical insights and deliver analytical outcomes for projects focused on semiconductor and materials characterization.
Responsibilities
- Operate Dual Beam FIB/SEM systems for a variety of materials analysis tasks.
- Prepare TEM lamella and perform cross-sectioning procedures.
- Conduct imaging to support materials characterization efforts.
- Collaborate with cross-functional teams to provide technical consultation.
- Deliver analytical results for semiconductor and materials characterization initiatives.
Qualifications
- Master’s or Doctorate degree in Materials Science and Engineering or a closely related discipline.
- Proficiency in electron microscopy and FIB/SEM technology.
- U.S. Person status to ensure compliance with ITAR regulations.
- Willingness to work night shift schedules when required.
