Job Summary
The scientist is responsible for utilizing Dual Beam FIB/SEM systems to conduct TEM lamella preparation, perform cross-sectioning, and achieve imaging for the purpose of materials analysis. Additionally, the individual will engage with cross-functional teams to offer technical insights and deliver analytical outcomes for projects focused on semiconductor and materials characterization.
Responsibilities
- Operate Dual Beam FIB/SEM systems for a variety of materials analysis tasks.
- Prepare TEM lamella and perform cross-sectioning procedures.
- Conduct imaging to support materials characterization efforts.
- Collaborate with cross-functional teams to provide technical consultation.
- Deliver analytical results for semiconductor and materials characterization initiatives.
Qualifications
- Master’s or Doctorate degree in Materials Science and Engineering or a closely related discipline.
- Proficiency in electron microscopy and FIB/SEM technology.
- U.S. Person status to ensure compliance with ITAR regulations.
- Willingness to work night shift schedules when required.
Eurofins provides equal employment opportunities to all employees and applicants for employment and prohibits discrimination and harassment of any type without regard to race, color, religion, age, sex, national origin, disability status, genetics, protected veteran status, sexual orientation, gender identity or expression, or any other characteristic protected by federal, state or local laws.
